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紫外脉冲激光烧蚀沉积Ta2O5薄膜过程的研究

A Study on Deposition Process for UV Laser Ablation of Ta2O5

  • 摘要: 对355nm激光烧蚀沉积Ta2O5薄膜的过程进行了研究。由时间分辨四极质谱测得烧蚀Ta2O5产生的正离子有Ta+、O+、TaO+和TaO2+,中性粒子有O、Ta、TaO和TaIO2,并测定了它们的飞行时间(TOF)谱。在不同压强的O2气氛下,由测得的时间分辨发光光谱表明,烧蚀产物在向基片飞行过程在发生了氧化反应。对沉积薄膜的组成分析表明,钽及其氧化物在基片上存在进一步氧化过程。

     

    Abstract: The process of pulsed 355nm laser ablation deposition of Ta2O5 film in the O2 ambient is investigated.The time-resolved quadrupole mass spectrometric measurements show that the nascent ions and neutral species produced by laser ablation of Ta2O5 in high vacuum are Ta+,O+,TaO+,TaO+ 2,and Ta,O,TaO,TaO2,respectively.The measured TOF spectra indicate that the velocities of ablated ion species are faster than that of neutral species.In the O2 ambient,emission spectra from excited ions,atoms and molecular oxides in the plume are observed.The time-resolved emission spectra of the plume at diffevent O2 ambient pressure show that part of the excited tantalum oxid emolecules are formed from the reactive collisions of the ablated tantalum containing species with oxygen.Compositional analysis of the deposited films reveals that the reactive collisions in the gas phase and subsequent oxidation of the deposited film on the substrate are responsible for the production of the high quality Ta2O5 film in the oxygen ambient.

     

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