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    Kong Xianggui, Lu Yichun, Er Shulin. The Electronic Characteristics of Heterojunction at CuPc/InP Interface and the Effect on Raman Scattering of CuPc LB Film[J]. Chinese Journal of Chemical Physics , 1995, 8(1): 41-45.
    Citation: Kong Xianggui, Lu Yichun, Er Shulin. The Electronic Characteristics of Heterojunction at CuPc/InP Interface and the Effect on Raman Scattering of CuPc LB Film[J]. Chinese Journal of Chemical Physics , 1995, 8(1): 41-45.
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    The Electronic Characteristics of Heterojunction at CuPc/InP Interface and the Effect on Raman Scattering of CuPc LB Film

      Abstract
    • The characteristes or current density-voltage （J-V）and capacitance-voltage of Cupc/InP rectifying heterojuction energy barrier is first measured, and that the density of states at Cupc/InP interface effects on Raman scattering of Cupc LB film arc studied.
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