Study of AES of Electrochemical Anodic Film on HCT Crystal

Auger Electron Spetra （AES） study is carried out with the anodic film on Hg_1-xCd_xTe, x～0.21（HCT）, crystal. The depth profilc and stoichiometry or clements with in both the filmandthe interface with the HCT substrate are measured by means of Ar⁺ ion sputtering. Influences of current density,and potential,as well as electrolyte concentration during anodic process arc illustrated on the AES of the film.