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Electrochemical Studies on the Hydrophilic Mechanism of TiO2 Thin Films under UV Irradiation
Wo Songtao,Cui Xiaoli,Zhang Qun,Yang Xiliang,Zhang Zhuangjian*
Author NameAffiliationE-mail
Wo Songtao Department of Materials ScienceFudan UniversityShanghai 200433  
Cui Xiaoli Department of Materials ScienceFudan UniversityShanghai 200433  
Zhang Qun Department of Materials ScienceFudan UniversityShanghai 200433  
Yang Xiliang Department of Materials ScienceFudan UniversityShanghai 200433  
Zhang Zhuangjian* Department of Materials ScienceFudan UniversityShanghai 200433 xiaolicui@fudan.edu.cn 
Abstract:
The nanometer films of TiO2 were prepared by sol-gel method on ITO(Indium-tin oxide,SnO2:In) substrate. The TiO2 film was the anatase phase with a particle size of 100 nm from the measurements of X-ray diffraction and AFM(Atomic-Force-Microscope). Electrochemical characteristics of ITO/ TiO2 electrode under UV(ultraviolet)irradiation were investigated using the method of cyclic voltammetry. A new oxidative peak was observed at 0.035 V when the TiO2 electrode was irradiated by 253.7 nm UV light for a certain time. The peak current increased with the irradiation time. It was assumed that the new oxidative peak resulted from Ti3+,which was formed during the UV illumination. The changes of hydrophilicity of the TiO2 thin film on ITO under UV light were also observed. It was assumed that the changes of hydrophilicity of the films may be related with the formation of Ti3+ on the surface when the film was irradiated by UV light.
Key words:  Film of TiO2,Cyclic voltammetry,UV light,Hydrophilicity
FundProject:
紫外光下纳米TiO2薄膜亲水性机理的电化学研究
沃松涛,崔晓莉,张群,杨锡良,章壮健*
摘要:
利用溶胶-凝胶方法在透明导电玻璃ITO(SnO2 : In)表面制备纳米TiO2薄膜,XRD谱图表明TiO2是锐钛矿晶型,AFM(Atomic-Force-Microscope)测得薄膜表面粒子约为100 nm. 研究了ITO 表面纳米TiO2薄膜的光致亲水性变化. 通过循环伏安技术测定TiO2薄膜电极在253.7 nm的紫外光照射后的电化学行为推测光致亲水性机理. 发现在紫外光照射一定时间后,TiO2薄膜电极的循环伏安图在+0.035 V处出现新的氧化峰;且随光照时间的增加,氧化峰的峰电流增大,溶液中的溶解氧对峰电流的大小有明显影响. 实验表明,在紫外光照下电极表面有Ti3+产生,证实了TiO2薄膜的光致亲水性转变过程与Ti3+的生成导致的表面结构变化有关.
关键词:  二氧化钛薄膜  循环伏安  紫外光  亲水性
DOI:10.1088/1674-0068/17/2/211-214
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