引用本文:
【打印本页】   【HTML】   【下载PDF全文】   View/Add Comment  【EndNote】   【RefMan】   【BibTex】
←前一篇|后一篇→ 过刊浏览    高级检索
本文已被:浏览 1723次   下载 1282 本文二维码信息
码上扫一扫!
分享到: 微信 更多
Probe the Effects of Surface Adsorbates on ZnO Nanowire Conductivity using Dielectric Force Microscopy
Qi Chen1,2, Wei Lu2, Yu-kun Wu3, Huai-yi Ding3, Bing Wang1, Liwei Chen*2
1.Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Tech-nology of China, Hefei 230026, China;2.i-Lab, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou 215123, China;3.Department of Physics, University of Science and Technology of China, Hefei 230026, China
Abstract:
Characterization of electric properties of nanomaterials usually involves fabricating field effect transistors (FET) and deriving materials properties from device performances. However, the quality of electrode contacts in FET devices heavily influences the device performance, which makes it difficult to obtain the intrinsic electric properties of nanomaterials. Dielectric force microscopy (DFM), a contactless method developed recently, can detect the low-frequency dielectric responses of nanomaterials without electric contact, which avoids the influence of electric contact and can be used to study the intrinsic conductivity of nanomaterials. Here we study the influences of surface adsorbates on the conductivity of ZnO nanowires (NWs) by using FET and DFM methods. The conductivity of ZnO NW is much larger in N2 atmosphere than that in ambient environment as measured by FET device, which is further proven by DFM measurement that the ZnO NW exhibits larger dielectric response in N2 environment, and the influence of electrode contacts on measurement can be ruled out. Based on these results, it can be concluded that the adsorbates on ZnO NW surface highly influence the conductivity of ZnO NW rather than the electrode contact. This work also verifies the capability of DFM in measuring electric properties of nanomaterials.
Key words:  Dielectric force microscopy, ZnO nanowire, Field-effect transistor, Surface adsorbate
FundProject:
介电力显微镜探测氧化锌纳米线表面吸附分子对电导率的影响
陈琪1,2, 卢威2, 吴昱昆3, 丁怀义3, 王兵1, 陈立桅*2
1.中国科学技术大学合肥微尺度物质科学国家实验室(筹),合肥 230026;2.中国科学院苏州纳米技术与纳米仿生研究所纳米研究国际实验室,苏州 215123;3.中国科学技术大学物理系,合肥 230026
摘要:
利用场效应晶体管器件和介电力显微镜来研究氧化锌纳米线表面吸附分子对其电导率的影响. 相比于空气中,ZnO纳米线场效应晶体管器件在氮气中电导率更高,介电力显微镜得的介电信号也是在氮气中更大. 影响ZnO纳米线电导率变化的主要原因是表面吸附分子数量的变化,而并不是电极与材料之间接触性质的变化.
关键词:  介电力显微镜,ZnO纳米线,场效应晶体管,表面吸附分子
DOI:10.1063/1674-0068/27/05/582-586
分类号: