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Chemical Effect on K Shell X-ray Fluorescence Parameters and Radiative Auger Ratios of Co, Ni, Cu, and Zn Complexes
Erhan Cengiz*,Zekeriya Biyiklioglu,Nuray Kup Aylikci,Volkan Aylikci,Gokhan Apaydin,Engin Tirasglu,Halit Kantekin
Author NameAffiliationE-mail
Erhan Cengiz* Department of Physics, Faculty of Arts and Science, Karadeniz Technical University, Trabzon 61080, Turkey erhan_cengiz@ktu.edu.tr 
Zekeriya Biyiklioglu Department of Chemistry, Faculty of Arts and Science, Karadeniz Technical University, Trabzon 61080, Turkey  
Nuray Kup Aylikci Department of Physics, Faculty of Arts and Science, Karadeniz Technical University, Trabzon 61080, Turkey  
Volkan Aylikci Department of Physics, Faculty of Arts and Science, Karadeniz Technical University, Trabzon 61080, Turkey  
Gokhan Apaydin Department of Physics, Faculty of Arts and Science, Karadeniz Technical University, Trabzon 61080, Turkey  
Engin Tirasglu Department of Physics, Faculty of Arts and Science, Karadeniz Technical University, Trabzon 61080, Turkey  
Halit Kantekin Department of Chemistry, Faculty of Arts and Science, Karadeniz Technical University, Trabzon 61080, Turkey  
Abstract:
The production cross-sections, intensity ratios, and radiative Auger intensity ratios of Co, Ni, Cu, and Zn elements in different complexes were measured. The chemical effects on the K shell fluorescence parameters and the radiative Auger intensity ratios of these elements were investigated and the changes in these parameters were interpreted according to the charge transfer process. The samples were excited by 59.5 keV γ-rays from a 241Am annular radioactive source. K X-rays emitted by samples were counted by an Ultra-LEGe detector with a resolution of 150 eV at 5.9 keV.
Key words:  Charge transfer, Cross-section, Radiative Auger intensity ratio, Ultra-LEGe detector, Chemical effect
FundProject:
Chemical Effect on K Shell X-ray Fluorescence Parameters and Radiative Auger Ratios of Co, Ni, Cu, and Zn Complexes
Erhan Cengiz*,Zekeriya Biyiklioglu,Nuray Kup Aylikci,Volkan Aylikci,Gokhan Apaydin,Engin Tirasglu,Halit Kantekin
摘要:
对钴、镍、铜、锌元素组成的不同配合物K壳层X射线的产生截面、谱线强度比、俄歇辐射强度比进行了测定,同时研究了化学效应对K壳荧光参数和俄歇辐射强度比的影响,并根据电荷转移过程解释了这些参数的变化. 采用59.5 keV的γ射线241Am的环形放射源对样品进行激发. 用分辨率为150eV的Ultra-LEGe探测器在5.9 keV测定样品产生的K壳X射线.
关键词:  电荷转移,横截面,俄歇辐射强度比,Ultra-LEGe探测器,化学效应
DOI:10.1088/1674-0068/23/02/138-144
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