Pattern Recognition Analysis of Lattice-match and Thermo-match for Sample Collection Containing ZnO Semiconductor Material
- Received Date: 2000-01-28
- ZnO, lattice-match, Thermo-match, Pattern recognition analysis /
Abstract: Some pattern recognition methods including dynamic clustering analysis, minimal spanning tree and principal component analysis have been used to recognize the extents of both lattice-match and thermo-matchat300KforthesamplescontainingZnOsemiconductormaterial. Fromthepatternrecognitionanal-ysis, it is concluded that there exists a lower lattice and thermal misfitsbetween ZnOand threeⅢ-Ⅴgroup nitrides. The results alsoshow that pattern recognition analysisseems to be asuitable tool toselect substrate or bufferlayerforepitaxygrowth, aswellastodesignoptoelectronicdevicesofblueandvioletlightsemicon-ductor materials, such as ZnO and GaN.
|Citation:||Zhang Zhaochun, Cui Deliang, Huang Baibiao, Jiang Minhua. Pattern Recognition Analysis of Lattice-match and Thermo-match for Sample Collection Containing ZnO Semiconductor Material[J]. Chinese Journal of Chemical Physics , 2000, 13(5): 562-566. doi: 10.1088/1674-0068/13/5/562-566|