Thickness Impacts of Vacancy Defects in Epitaxial La0.7Sr0.3MnO3Thin Films Using Slow Positron Beam
- Received Date: 2010-06-08
Abstract: Thickness effects of thin La0.7Sr0.3MnO3 (LSMO) films on (LaAlO3)0:3(Sr2AlTaO6)0:7 sub-strates were examined by a slow positron beam technique. Doppler-broadening line shape parameter S was measured as a function of thickness and differnt annealing conditions. Re-sults reveal there could be more than one mechanism to induce vacancy-like defects. It was found that strain-induced defects mainly influence the S value of the in situ oxygen- ambience annealing LSMO thin films and the strain could vanish still faster along with the increase of thickness, and the oxygen-deficient induced defects mainly affect the S value of post-annealing LSMO films.
|Citation:||刘建党, 成斌, 杜淮江, 叶邦角. Thickness Impacts of Vacancy Defects in Epitaxial La0.7Sr0.3MnO3Thin Films Using Slow Positron Beam[J]. Chinese Journal of Chemical Physics , 2010, 23(6): 685-688. doi: 10.1088/1674-0068/23/06/685-688|