刘建党, 成斌, 杜淮江, 叶邦角. Thickness Impacts of Vacancy Defects in Epitaxial La0.7Sr0.3MnO3Thin Films Using Slow Positron Beam[J]. Chinese Journal of Chemical Physics , 2010, 23(6): 685-688. doi: 10.1088/1674-0068/23/06/685-688
Citation: 刘建党, 成斌, 杜淮江, 叶邦角. Thickness Impacts of Vacancy Defects in Epitaxial La0.7Sr0.3MnO3Thin Films Using Slow Positron Beam[J]. Chinese Journal of Chemical Physics , 2010, 23(6): 685-688. doi: 10.1088/1674-0068/23/06/685-688

Thickness Impacts of Vacancy Defects in Epitaxial La0.7Sr0.3MnO3Thin Films Using Slow Positron Beam

doi: 10.1088/1674-0068/23/06/685-688
Funds:  This work was supported by the National Natural Science Foundation of China (No.10835006). Jian-dang Liu is grateful to Ph.D Cheng-xiao Peng, Shao-wei Jin, and Xiang-lei Chen for enlightening discussions and other colleagues' enjoyable collaboration.
  • Received Date: 2010-06-08
  • Thickness effects of thin La0.7Sr0.3MnO3 (LSMO) films on (LaAlO3)0:3(Sr2AlTaO6)0:7 sub-strates were examined by a slow positron beam technique. Doppler-broadening line shape parameter S was measured as a function of thickness and differnt annealing conditions. Re-sults reveal there could be more than one mechanism to induce vacancy-like defects. It was found that strain-induced defects mainly influence the S value of the in situ oxygen- ambience annealing LSMO thin films and the strain could vanish still faster along with the increase of thickness, and the oxygen-deficient induced defects mainly affect the S value of post-annealing LSMO films.
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Thickness Impacts of Vacancy Defects in Epitaxial La0.7Sr0.3MnO3Thin Films Using Slow Positron Beam

doi: 10.1088/1674-0068/23/06/685-688
Funds:  This work was supported by the National Natural Science Foundation of China (No.10835006). Jian-dang Liu is grateful to Ph.D Cheng-xiao Peng, Shao-wei Jin, and Xiang-lei Chen for enlightening discussions and other colleagues' enjoyable collaboration.

Abstract: Thickness effects of thin La0.7Sr0.3MnO3 (LSMO) films on (LaAlO3)0:3(Sr2AlTaO6)0:7 sub-strates were examined by a slow positron beam technique. Doppler-broadening line shape parameter S was measured as a function of thickness and differnt annealing conditions. Re-sults reveal there could be more than one mechanism to induce vacancy-like defects. It was found that strain-induced defects mainly influence the S value of the in situ oxygen- ambience annealing LSMO thin films and the strain could vanish still faster along with the increase of thickness, and the oxygen-deficient induced defects mainly affect the S value of post-annealing LSMO films.

刘建党, 成斌, 杜淮江, 叶邦角. Thickness Impacts of Vacancy Defects in Epitaxial La0.7Sr0.3MnO3Thin Films Using Slow Positron Beam[J]. Chinese Journal of Chemical Physics , 2010, 23(6): 685-688. doi: 10.1088/1674-0068/23/06/685-688
Citation: 刘建党, 成斌, 杜淮江, 叶邦角. Thickness Impacts of Vacancy Defects in Epitaxial La0.7Sr0.3MnO3Thin Films Using Slow Positron Beam[J]. Chinese Journal of Chemical Physics , 2010, 23(6): 685-688. doi: 10.1088/1674-0068/23/06/685-688

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