Study on the Anodic Oxide Film of HgCdTe by XPS

Yang Xiaoyun, Cui Yongjie, Shi Yanli. Study on the Anodic Oxide Film of HgCdTe by XPS[J]. Chinese Journal of Chemical Physics , 1997, 10(3): 284-286.

Citation:

Yang Xiaoyun, Cui Yongjie, Shi Yanli. Study on the Anodic Oxide Film of HgCdTe by XPS[J]. Chinese Journal of Chemical Physics , 1997, 10(3): 284-286.

Citation:

Yang Xiaoyun, Cui Yongjie, Shi Yanli. Study on the Anodic Oxide Film of HgCdTe by XPS[J]. Chinese Journal of Chemical Physics , 1997, 10(3): 284-286.

Abstract

The anodic oxide films of HgCdTe was studied by depth profile X-ray photoelectron spectroscopy.The results show,apart from TeO₂,CdTe₂O₅ and HgTe₂O₅,elemental Te and Cd are also found in the oxide film.In the interface,Te₂O₅^2- changes to TeO₃^2- with the increase of profile depth.

FullText(HTML)

Export File