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    Wei Guang, Han Guobin, Wu Jintian. A Study of the Relation of Film Disjoining Pressure and Film Thickness by Microinterferometric Technique[J]. Chinese Journal of Chemical Physics , 1999, 12(2): 129-132.
    Citation: Wei Guang, Han Guobin, Wu Jintian. A Study of the Relation of Film Disjoining Pressure and Film Thickness by Microinterferometric Technique[J]. Chinese Journal of Chemical Physics , 1999, 12(2): 129-132.

    A Study of the Relation of Film Disjoining Pressure and Film Thickness by Microinterferometric Technique

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