EXAFS Studies on the Local Structures of Supported Ni/SiO2
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Abstract
The EXAFS results show that the K-edge EXAFS spectra of Ni foil obtaining from laboratory EXAFS apparatus is near the same as that from synchrotron radiation facility.It indicates that high quality experiment data can be measured with our laboratory EXAFS apparatus.The radial distribution functions of supported Ni/SiO2 suggest that the position of the main amplitude peak R=0.220nm keeps no change but the magnitude intensity of the main amplitude peak gradully drop as the Ni supported concentration decreases.The fitting results show that the disorder factor σ increases from 0.0068nm to 0.0094nm and the coordination number decreases from 12.0 to 10.5 while the Ni supported concentration is 2.5% on SiO2.
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