Probing Optical Propagation of Exciton Polaritons in Ultrathin van der Waals Microcrystals down to Few Monolayers

Talha Ijaz; Qi Bian; Yan Cao; Haoxuan Ding; Xiaorui Chen; Huan Lu; Shu Yang; Xueting Xing; Simin Fang; Mengyuan Liu; Xin Zhang; Jianzhi Gao; Minghu Pan

doi:10.1063/1674-0068/cjcp2303024

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Talha Ijaz, Qi Bian, Yan Cao, Haoxuan Ding, Xiaorui Chen, Huan Lu, Shu Yang, Xueting Xing, Simin Fang, Mengyuan Liu, Xin Zhang, Jianzhi Gao, Minghu Pan. Probing Optical Propagation of Exciton Polaritons in Ultrathin van der Waals Microcrystals down to Few Monolayers[J]. Chinese Journal of Chemical Physics . doi: 10.1063/1674-0068/cjcp2303024

Citation:

Talha Ijaz, Qi Bian, Yan Cao, Haoxuan Ding, Xiaorui Chen, Huan Lu, Shu Yang, Xueting Xing, Simin Fang, Mengyuan Liu, Xin Zhang, Jianzhi Gao, Minghu Pan. Probing Optical Propagation of Exciton Polaritons in Ultrathin van der Waals Microcrystals down to Few Monolayers[J]. Chinese Journal of Chemical Physics . doi: 10.1063/1674-0068/cjcp2303024

Citation:

Talha Ijaz, Qi Bian, Yan Cao, Haoxuan Ding, Xiaorui Chen, Huan Lu, Shu Yang, Xueting Xing, Simin Fang, Mengyuan Liu, Xin Zhang, Jianzhi Gao, Minghu Pan. Probing Optical Propagation of Exciton Polaritons in Ultrathin van der Waals Microcrystals down to Few Monolayers[J]. Chinese Journal of Chemical Physics . doi: 10.1063/1674-0068/cjcp2303024

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Probing Optical Propagation of Exciton Polaritons in Ultrathin van der Waals Microcrystals down to Few Monolayers

doi: 10.1063/1674-0068/cjcp2303024

Talha Ijaz¹,
Qi Bian²,
Yan Cao³,
Haoxuan Ding⁴,
Xiaorui Chen⁵,
Huan Lu⁶,
Shu Yang^{7, 8},
Xueting Xing¹,
Simin Fang¹,
Mengyuan Liu¹,
Xin Zhang^{9
,
,},
Jianzhi Gao^{1
,
,},
Minghu Pan^{1, 2
,
,}

1.
School of Physics and Information Technology, Shaanxi Normal University, Xi’an 710062, China
2.
School of Physics, Huazhong University of Science and Technology, Wuhan 430074, China
3.
College of Physics and Electronic Information, Luoyang Normal University, Luoyang 471934, China
4.
School of Physics and Astronomy, University of Birmingham, Birmingham B15 2TT, United Kingdom
5.
School of Mechanical and Material Engineering, Xi’an University, Xi’an 710065, China
6.
School of Geography and Tourism, Shaanxi Normal University, Xi’an 710119, China
7.
School of Information Science and Engineering, Fudan University, Shanghai 200433, China
8.
Zhuhai Fudan Innovation Institute, Zhuhai 519000, China
9.
School of Physics, Northwest University, Xi’an 710069, China

More Information

Corresponding author: E-mail: xzhang@nwu.edu.cn; Jianzhigao@snnu.edu.cn; minghupan@snnu.edu.cn
Received Date: 2023-03-16
Accepted Date: 2023-05-09

Available Online: 2023-05-11

Abstract

Abstract

The exciton polariton is a kind of quasiparticles and provides a promising opportunity to explore fundamental quantum phenomena for photonic applications. Transition-metal dichalcogenide (TMD) materials provide the platform of nanophotonics that supports the propagative exciton polaritons even at room-temperature. Previously, real space studies on thin flakes of TMDs by scattering-type scanning nearfield optical microscopy (s-SNOM) were limited to waveguide thickness down to 30 nm. In this work, we present the nano-optical imaging of ordinary transverse electric modes of exciton polaritons in MoS₂ and WSe₂ down to a few atomic layers, measured by atomic force microscope-based s-SNOM. Surprisingly, the interference fringe patterns can be observed clearly at the prepared ultrathin TMD flakes with thickness down to ~3 nm (4 ML) and ~8 nm (12 ML) for MoS₂ and WSe₂, respectively, which breaks greatly the previous measurement limitation. The wavevectors stay around 1.6–1.7k₀ constantly when the thickness approaching to a few MLs, instead of 1k₀ according to the theory. These modes are supported by the nearly-freestanding TMD microflakes in the form of three-layer symmetric waveguide to confine the exciton polaritons. Our results provide in-depth understanding and open new avenues to explore the polaritonic devices operating at the near infrared region based on ultrathin TMD materials.
- Two-dimensional TMD material,
- Scattering-type scanning near-field optical microscopy,
- Exciton polariton

These authors contributed equally to this work.

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References(35)

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