Atomic Force Mocroscopy Characterization of Thiols Self-Assembled Monolayers on Gold Surfaces
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Abstract
Self - assembled monolayers of n - butanethiol, n - dodecanethiol and their equimolar mixture on gold surfaces, were observed and characterized using atomic force microscope (AFM). AFM images of three monolayers were obtained. All of the images exhibit a periodic hexagonal pattern of equivalent spacting, nearest - neighbor distances of 0. 50nm, 0. 52nm, 0. 52nm and 0. 51nm repectively. These spacings agree well with the analogous 0. 50nm distance of a ( \sqrt3×\sqrt3)R30° adlayer on a Au(111) lattice. The thicknesses of monolayers obtained with AFM, ARE 0. 67NM, 1. 60nm and 1. 30nm respectively.
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