Surface Structure of Fluorinated Si(100)
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Abstract
The structure of a fluorinated Si(100) surface is studied by He atom diffraction. He diffraction measurements show that Si dangling bonds are the sites for fluorine adsorption. Molecular fluorine reaction with Si(100) 2×1 does not perturb the Si-Si dimer bond and the reaction virtually ceases at one monolayer of F coverage for F2 at low incident kinetic energy. Further reaction of F2 with fluorinated surface can be activated by increasing the F2 incident energy. No ordered surface structure is observed after exposure to high energy fluorine.
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