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    Jin Aiping, Chen Wen, Zhu Quanyao. Structure and Properties of V2O5 Thin Films Prepared by Electrophoresis Deposition[J]. Chinese Journal of Chemical Physics , 2005, 18(5): 812-816. DOI: 10.1088/1674-0068/18/5/812-816
    Citation: Jin Aiping, Chen Wen, Zhu Quanyao. Structure and Properties of V2O5 Thin Films Prepared by Electrophoresis Deposition[J]. Chinese Journal of Chemical Physics , 2005, 18(5): 812-816. DOI: 10.1088/1674-0068/18/5/812-816

    Structure and Properties of V2O5 Thin Films Prepared by Electrophoresis Deposition

    • V2O5 thin films were successfully prepared on ITO substrate with electrophoresis deposition (EDP) through V2O5 sol. X-ray diffraction and scanning electron microscopy were used for studying the structure of the films. The optical and electrochemical properties were measured by the transmittance spectra and cyclic voltammetry measurements, respectively. It is found that V2O5 thin films deposited by EDP are a compact microstructure with finer adhesive force with ITO substrate and the thickness is uniform. During the cycle experiment, the films exhibited reversible two-color (yellow at oxidation and green at reduction) with a maximum transmittance change of around 30%. Moreover, the films had an excellent cycle for lithium intercalation/deintercalation and good cycle stability, the cycle efficiency for the 50th cycle was 88.02% and the films still had fine adhesive force with ITO substrate with no dissolving over more than 50 cycles. The Li+ diffusion coefficient in V2O5 thin film was 5.10×10-12 cm2/s by the electrochemical impedance spectra method. All results indicate that V2O5 thin films by the electrophoresis deposition may be suitable for the use in the electrochromic devices.
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