Unveiling Defect-Mediated Carrier Dynamics in Few-Layer MoS<sub>2</sub> Prepared by Ion Exchange Method via Ultrafast Vis-NIR-MIR Spectroscopy<sup>†</sup>

Zhen Chi; Hui-hui Chen; Zhuo Chen; Hai-long Chen

doi:10.1063/1674-0068/cjcp2007123

Zhen Chi, Hui-hui Chen, Zhuo Chen, Hai-long Chen. Unveiling Defect-Mediated Carrier Dynamics in Few-Layer MoS2 Prepared by Ion Exchange Method via Ultrafast Vis-NIR-MIR Spectroscopy†[J]. Chinese Journal of Chemical Physics , 2020, 33(5): 547-553. DOI: 10.1063/1674-0068/cjcp2007123

Citation:

Zhen Chi, Hui-hui Chen, Zhuo Chen, Hai-long Chen. Unveiling Defect-Mediated Carrier Dynamics in Few-Layer MoS2 Prepared by Ion Exchange Method via Ultrafast Vis-NIR-MIR Spectroscopy†[J]. Chinese Journal of Chemical Physics , 2020, 33(5): 547-553. DOI: 10.1063/1674-0068/cjcp2007123

Citation:

Zhen Chi, Hui-hui Chen, Zhuo Chen, Hai-long Chen. Unveiling Defect-Mediated Carrier Dynamics in Few-Layer MoS2 Prepared by Ion Exchange Method via Ultrafast Vis-NIR-MIR Spectroscopy†[J]. Chinese Journal of Chemical Physics , 2020, 33(5): 547-553. DOI: 10.1063/1674-0068/cjcp2007123

Unveiling Defect-Mediated Carrier Dynamics in Few-Layer MoS₂ Prepared by Ion Exchange Method via Ultrafast Vis-NIR-MIR Spectroscopy^†

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Unveiling Defect-Mediated Carrier Dynamics in Few-Layer MoS2 Prepared by Ion Exchange Method via Ultrafast Vis-NIR-MIR Spectroscopy†

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Unveiling Defect-Mediated Carrier Dynamics in Few-Layer MoS₂ Prepared by Ion Exchange Method via Ultrafast Vis-NIR-MIR Spectroscopy^†