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    Yi Peng, Eduardo Y. Hirata, Wanzhang Pan, Limei Chen, Jia En Lu, Shaowei Chen. Intraparticle Charge Delocalization through Conjugated Metal-Ligand Interfacial Bonds: Effects of Metal d Electrons†[J]. Chinese Journal of Chemical Physics , 2018, 31(4): 433-438. DOI: 10.1063/1674-0068/31/cjcp1804073
    Citation: Yi Peng, Eduardo Y. Hirata, Wanzhang Pan, Limei Chen, Jia En Lu, Shaowei Chen. Intraparticle Charge Delocalization through Conjugated Metal-Ligand Interfacial Bonds: Effects of Metal d Electrons†[J]. Chinese Journal of Chemical Physics , 2018, 31(4): 433-438. DOI: 10.1063/1674-0068/31/cjcp1804073

    Intraparticle Charge Delocalization through Conjugated Metal-Ligand Interfacial Bonds: Effects of Metal d Electrons

    • Intraparticle charge delocalization occurs when metal nanoparticles are functionalized with organic capping ligands through conjugated metal-ligand interfacial bonds. In this study, metal nanoparticles of 5d metals (Ir, Pt, and Au) and 4d metals (Ru, Rh, and Pd) were prepared and capped with ethynylphenylacetylene and the impacts of the number of metal d electrons on the nanoparticle optoelectronic properties were examined. Both FTIR and photoluminescence measurements indicate that intraparticle charge delocalization was enhanced with the increase of the number of d electrons in the same period with palladium being an exception.
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