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Yu-kun Wu, A-wei Zhuang, Chun-miao Ye, Jie Zeng, Nan Pan, Xiao-ping Wang. Effect of Screw-Dislocation on Electrical Properties of Spiral-Type Bi2Se3 Nanoplates[J]. Chinese Journal of Chemical Physics , 2016, 29(6): 687-692. DOI: 10.1063/1674-0068/29/cjcp1605107
Citation: Yu-kun Wu, A-wei Zhuang, Chun-miao Ye, Jie Zeng, Nan Pan, Xiao-ping Wang. Effect of Screw-Dislocation on Electrical Properties of Spiral-Type Bi2Se3 Nanoplates[J]. Chinese Journal of Chemical Physics , 2016, 29(6): 687-692. DOI: 10.1063/1674-0068/29/cjcp1605107

Effect of Screw-Dislocation on Electrical Properties of Spiral-Type Bi2Se3 Nanoplates

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  • Received Date: May 11, 2016
  • Revised Date: July 24, 2016
  • We systematically investigated the electrical properties of spiral-type and smooth Bi2Se3 nanoplates through field effect transistor and conductive atomic force microscopy (CAFM) measurement. It is observed that both nanoplates possess high conductivity and show metallic-like behavior. Compared to the smooth nanoplate, the spiral-type one exhibits the higher carrier concentration and lower mobility. CAFM characterization reveals that the conductance at the screw-dislocation edge is even higher than that on the terrace, implying that the dislocation can supply excess carriers to compensate the low mobility and achieve high conductivity. The unique structure and electrical properties make the spiral-type Bi2Se3 nanoplates a good candidate for catalysts and gas sensors.
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